NX-Hivac – High Vacuum AFM

High vacuum atomic force microscope
for failure analysis and atmosphere-sensitive materials research

Park NX-Hivac allows failure analysis engineers to improve the sensitivity and repeatability of their AFM measurements through a high vacuum environment. Because high vacuum measurement offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wider range of signal response in various failure analysis applications, such as dopant concentration of Scanning Spreading Resistance Microscopy (SSRM).

Park NX-Hivac enables materials scientific research that requires high accuracy and high-resolution measurements in a vacuum environment free from oxygen and other agents.