{"id":1885,"date":"2022-01-09T14:29:27","date_gmt":"2022-01-09T08:29:27","guid":{"rendered":"https:\/\/umclbd.com\/?post_type=product&#038;p=1885"},"modified":"2022-01-14T20:36:29","modified_gmt":"2022-01-14T14:36:29","slug":"park-nx10-atomic-force-microscope","status":"publish","type":"product","link":"https:\/\/umclbd.com\/?product=park-nx10-atomic-force-microscope","title":{"rendered":"Park NX10 \u2013 Atomic Force Microscope"},"content":{"rendered":"<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\">\n<div class=\"col-1 row-item\">\n<h2 class=\"lined\">Accurate AFM Solutions for General Research<\/h2>\n<div class=\"col-1_2\">\n<div class=\"row-item\">\n<h4 class=\"lined\">Tall Sample\u00a01.5 \u00b5m step height<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/tallsample-step-height.jpg\" alt=\"tallsample-step-height\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>Scan Mode: Non-contact mode, Topography from Z position sensor<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<div class=\"col-1_2\">\n<div class=\"row-item\">\n<h4 class=\"lined\">Flat Sample\u00a0Atomic steps of sapphire wafer<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/flatsample-Atomic-step-of-sapphire-wafer.jpg\" alt=\"flatsample-Atomic-step-of-sapphire-wafer\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>0.3 nm step height, Scan Mode: Non-contact mode, Topography from Z position sensor<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<div class=\"gap-30\"><\/div>\n<div class=\"col-1_2\">\n<div class=\"row-item\">\n<h4 class=\"lined\">Hard Sample\u00a0Tungsten film<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/hardsample-tungsten-film.jpg\" alt=\"hardsample-tungsten-film\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>Scan Mode: Non-contact mode, Topography from Z position sensor<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<div class=\"col-1_2\">\n<div class=\"row-item\">\n<h4 class=\"lined\">Soft Sample\u00a0Collagen fibril<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/softsample-collagen-fibril.jpg?v=1.2\" alt=\"softsample-collagen-fibril\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>Scan Mode: Non-contact mode, Topography from Z position sensor<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"d-line\"><\/div>\n<h2 class=\"lined\">Accurate AFM Measurement with Low Noise Z Detector<\/h2>\n<div class=\"col-1_2 row-item\">\n<h3>Low Noise Z Detector of Park nx10 AFM<\/h3>\n<ul class=\"b-list iconok m-circle\">\n<li>Key technological advance and design feature of NX platform<\/li>\n<li>Noise level is the lowest in the industry, unmatched by any other<\/li>\n<li>Used as the default topography signal<\/li>\n<\/ul>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\">\n<p>The Z detector is the key technological advance of the new NX-series AFM. It is a new type of strain gauge sensor, innovated by Park. At 0.2 Angstrom, it is the best Z-detector noise in the industry. The noise level is low enough for Z-detector to be used as the default topography signal. If we compare the new NX-series AFM with the previous generation of our AFM model, XE, one can tell the difference. If the Z-detector noise is too high, one cannot clearly observe the atomic steps on the sapphire wafer. The height signal from the Z detector of the Park NX AFM has a noise level, identical to that of the Z-voltage-based topography.<\/p>\n<\/div>\n<div class=\"gap-30\"><\/div>\n<div class=\"col-1_2 row-item\">\n<h4 class=\"lined\">Park NX\u00a0Series<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/Z-detector-img-nx.jpg\" alt=\"Z-detector-img-nx\" \/>The noise level of the Z position detectors of the Park NX<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\"><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/Z-detector-img-nx2.jpg\" alt=\"Z-detector-img-nx2\" \/>The topography images of a sapphire wafer obtained from nx10<\/div>\n<div class=\"gap-30\"><\/div>\n<div class=\"col-1_2 row-item\">\n<h4 class=\"lined\">Park XE Series<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/Z-detector-img-xe.jpg\" alt=\"Z-detector-img-xe\" \/>The noise level of the Z position detectors of the Park XE<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\"><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/Z-detector-img-xe2.jpg\" alt=\"Z-detector-img-xe2\" \/>The topography images of a sapphire wafer obtained from XE-100<\/div>\n<div class=\"d-line\"><\/div>\n<div class=\"col-1 row-item\">\n<h2 class=\"lined\">Accurate AFM Scan by True Non-Contact\u2122 Mode<\/h2>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 vs-line row-item\">\n<h3 class=\"skyblue\">True Non-Contact\u2122 Mode<\/h3>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/technical\/park-afm-true_non_contact_mode.jpg\" alt=\"park-afm-true_non_contact_mode\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>Less tip wear = Prolonged high-resolution scan<\/li>\n<li>Non-destructive tip-sample interaction = Minimized sample modification<\/li>\n<li>Immunity from parameter-dependent results<\/li>\n<\/ul>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/non-contact-mode-image.jpg\" alt=\"non-contact-mode\" \/><\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\">\n<h3>Tapping Imaging<\/h3>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/technical\/park-afm-tapping-mode.jpg\" alt=\"park-afm-tapping-mode\" \/><\/p>\n<ul class=\"b-list exclamation m-circle\">\n<li>Quick tip wear = Blurred low-resolution scan<\/li>\n<li>Destructive tip-sample interaction = Sample damage and modification<\/li>\n<li>Highly parameter-dependent<\/li>\n<\/ul>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/tapping-imaging-image.jpg\" alt=\"tapping-imaging\" \/><\/p>\n<\/div>\n<div class=\"d-line\"><\/div>\n<h2 class=\"lined\">The Best User Convenience by Design<\/h2>\n<div class=\"col-1 row-item\">\n<h3>Easy Tip and Sample Exchange<\/h3>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/easy-tip.jpg\" alt=\"easy-tip\" \/><\/p>\n<p class=\"margin-30\">The unique head design allows easy side access allowing you to easily snap new tips and samples into place by hand. The cantilever is ready for scanning without the need for any tricky laser beam alignment by using pre-aligned cantilevers mounted onto the cantilever tip holder.<\/p>\n<\/div>\n<hr class=\"dashed\" \/>\n<div class=\"col-1 row-item\">\n<h3>Lightning Fast Automatic Tip Approach<\/h3>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/tip-approach.jpg\" alt=\"tip-approach\" \/><\/p>\n<p class=\"margin-30\">Our automatic tip-to-sample approach requires no user intervention and engages in just 10 seconds after loading the cantilever. By monitoring the cantilever response to the approaching surface, Park NX10 can initiate an automatic fast tip to sample approach within 10 seconds of cantilever loading. Fast feedback by the high-speed Z scanner and low noise signal processing by the NX electronics controller enable quick engagement to the sample surface without any user intervention. It just works, minimal user involvement required.<\/p>\n<\/div>\n<hr class=\"dashed\" \/>\n<div class=\"col-1 row-item\">\n<h3>Easy, Intuitive Laser Beam Alignment<\/h3>\n<p>&nbsp;<\/p>\n<p class=\"margin-30\">With our advanced pre-aligned cantilever holder, the laser beam is focused on the cantilever upon placement. Furthermore, the natural on-axis top-down view, the only one in the industry, allows you to easily find the laser spot. Since the laser beam falls vertically on the cantilever, you can intuitively move the laser spot along the X- and Y-axis by rotating its two positioning knobs. As a result, you can easily find the laser and position it on PSPD using our beam alignment user interface. From there, all you will need is a minor adjustment to maximize the signal to start acquiring the data.<\/p>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/tech\/laser-alignment.jpg\" alt=\"laser-alignment\" \/><\/p>\n<\/div>\n<\/div>\n<div id=\"tab-feature_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--feature_tab panel entry-content wc-tab\">\n<p>&nbsp;<\/p>\n<h2>Innovative features for innovative work<\/h2>\n<div class=\"col-1_2 row-item\">\n<div class=\"bg-white padding-15 margin-20\">\n<div><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx10\/smartscan-thum.jpg\" alt=\"smartscan\" \/><\/div>\n<h3>Park SmartScan\u00a0<strong>Auto Mode<\/strong><\/h3>\n<p>SmartScan Auto performs all the necessary operations for imaging and intelligently decides on the optimum image quality and scan speed, all autonomously. SmartScan Auto is made possible by Park\u2019s proprietary enabling technologies. That saves you time, money, and makes for a better end result.<\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"bg-white padding-15 margin-20\">\n<div><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx10\/crosstalk-elimination-tech.jpg\" alt=\"crosstalk-elimination-tech\" \/><\/div>\n<h3>Park Crosstalk Elimination\u00a0<strong>Technology<\/strong><\/h3>\n<p>Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. It features the world\u2019s only true non-contact AFM that prolongs tip life while preserving your sample, and flexure-based independent XY and Z scanner for unparalleled accuracy and resolution.<\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"bg-white padding-15\">\n<div><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx10\/afm-modes-thum.jpg\" alt=\"afm-modes\" \/><\/div>\n<h3>Park Advanced\u00a0<strong>AFM Modes<\/strong><\/h3>\n<p>Park AFMs features a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world\u2019s only true non-contact mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.<\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"bg-white padding-15\">\n<div><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx10\/nx10-sicm-module-thum.jpg\" alt=\"nx10-sicm-module\" \/><\/div>\n<h3>Park NX10\u00a0<strong>SICM Module<\/strong><\/h3>\n<p>Park NX10 SICM Module provides nanoscale imaging for a wide range of applications, Cell Biology, Analytical Chemistry, Electrophysiology, Neuroscience.<\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<\/div>\n<p>&nbsp;<\/p>\n<\/div>\n<div id=\"tab-brochure_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--brochure_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<p>&nbsp;<\/p>\n<h3 class=\"select-title\">Brochures:<\/h3>\n<p><a href=\"http:\/\/analytical.omcbd.com\/wp-content\/uploads\/sites\/7\/2021\/03\/Park_NX10.pdf\">park_nx10<\/a><\/p>\n<\/div>\n<\/div>\n<div id=\"tab-specifications_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--specifications_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<div class=\"col-1 row-item\"><\/div>\n<div class=\"col-1 row-item\"><\/div>\n<div class=\"d-line\">\n<p><strong>\u00a0Z Scanner<\/strong><\/p>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">Guided high-force flexure scanner\u00a0<strong>Scan range<\/strong>: 15 \u00b5m (optional 30 \u00b5m)\u00a0<strong>Resolution<\/strong>: 0.015 nm\u00a0<strong>Position detector noise<\/strong>: 0.03 nm (bandwidth: 1 kHz)\u00a0<strong>Resonant frequency<\/strong>: &gt; 9 kHz (typically 10.5 kHz)<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>XY Scanner<\/h4>\n<p>Single module flexure XY-scanner with closed-loop control 50 \u00b5m \u00d7 50 \u00b5m (optional 10 \u00b5m \u00d7 10 \u00b5m or 100 \u00b5m \u00d7 100 \u00b5m)\u00a0<strong>Resolution\u00a0<\/strong>:\u00a00.05 nm\u00a0<strong>Position detector noise\u00a0<\/strong>:\u00a0&lt; 0.25 nm (bandwidth: 1 kHz)\u00a0<strong>Out-of-plane motion\u00a0<\/strong>:\u00a0&lt; 2 nm (over 40 \u00b5m scan)<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Stage<\/h4>\n<p><strong>Z stage range<\/strong>: 25 mm\u00a0<strong>Focus travel range<\/strong>: 15 mm\u00a0<strong>XY stage travel range<\/strong>: 20 mm x 20 mm\u00a0<strong>Sample size<\/strong>: Open space up to 100 mm x 100 mm, thickness up to 20 mm\u00a0<strong>Sample weight\u00a0<\/strong>: &lt; 500 g<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Vision<\/h4>\n<p>10x (0.21NA) ultra-long working distance lens (1\u00b5m resolution) 20x (0.42 NA) high-resolution, long working distance lens (0.6 \u00b5m resolution) Direct on-axis vision of sample surface and cantilever\u00a0<strong>Field-of-view<\/strong>: 480 \u00d7 360 \u00b5m (with 10\u00d7 objective lens)\u00a0<strong>CCD\u00a0<\/strong>: 1 Mpixel, 5 Mpixel (optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Software<\/h4>\n<h4>SmartScan\u2122<\/h4>\n<p>Dedicated system control and data acquisition software Adjusting feedback parameters in real time Script-level control through external programs (optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>XEI<\/h4>\n<p>AFM data analysis software<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Electronics<\/h4>\n<h4>Signal processing<\/h4>\n<p><strong>ADC\u00a0<\/strong>: 18 channels 4 high-speed ADC channels 24-bit ADCs for X, Y, and Z scanner position sensor\u00a0<strong>DAC\u00a0<\/strong>: 17 channels 2 high-speed DAC channels 20-bit DACs for X, Y, and Z scanner positioning\u00a0<strong>Maximum data size\u00a0<\/strong>: 4096 x 4096 pixels<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Integrated functions<\/h4>\n<p>3 channels of flexible digital lock-in amplifier Spring constant calibration (Thermal method, optional) Digital Q control<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>External signal access<\/h4>\n<p>20 embedded signal input\/output ports\u00a0<strong>5 TTL outputs<\/strong>: EOF, EOL, EOP, Modulation, and AC bias<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>AFM Modes (*Optionally available)<\/h4>\n<h4>Standard Imaging<\/h4>\n<p>True Non-Contact AFM PinPoint\u2122 AFM Basic Contact AFM Lateral Force Microscopy (LFM) Phase Imaging Intermittent (tapping) AFM<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>Force Measurement*<\/h4>\n<p>Force Distance (FD) Spectroscopy Force Volume Imaging<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>Dielectric\/Piezoelectric Properties*<\/h4>\n<p>Electric Force Microscopy (EFM) Dynamic Contact EFM (EFM-DC) Piezoelectric Force Microscopy (PFM) PFM with High Voltage<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>Mechanical Properties*<\/h4>\n<p>Force Modulation Microscopy (FMM) Nanoindentation Nanolithography Nanolithography with High Voltage Nanomanipulation Piezoelectric Force Microscopy (PFM)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>Magnetic Properties*<\/h4>\n<p>Magnetic Force Microscopy (MFM) Tunable MFM<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\"><\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Electrical Properties*<\/h4>\n<p>Conductive AFM IV Spectroscopy Kelvin Probe Force Microscopy (KPFM) Scanning Capacitance Microscopy (SCM) Scanning Spreading-Resistance Microscopy (SSRM) Scanning Tunneling Microscopy (STM) Scanning Tunneling Spectroscopy (STS) Time-Resolved Photo Current Mapping (PCM)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div class=\"spec\">\n<h4>Chemical Properties*<\/h4>\n<p>Chemical Force Microscopy with Functionalized Tip Electrochemical Microscopy (EC-AFM)<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>AFM Options<\/h4>\n<h4>Temperature Control<\/h4>\n<p>Heating &amp; Cooling Stage (-25\u00baC~180 \u00baC) 250 \u00baC Heating Stage 600 \u00baC Heating Stage<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Liquid Cells<\/h4>\n<p>Universal Liquid Cell Electrochemistry Cell Open Liquid Cell<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>Liquid Probehand<\/h4>\n<p>Designed for imaging in a general liquid environment Resistant to most buffer solutions including acid Contact and Non-contact AFM imaging in liquid<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Clip-type Chip Carrier<\/h4>\n<p>Can be used with an unmounted cantilever Tip bias function available for Conductive AFM and EFM\u00a0<strong>Tip bias range\u00a0<\/strong>: -10 V ~ 10 V<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div class=\"spec\">\n<h4>Magnetic Field Generator<\/h4>\n<p>Applies external magnetic field parallel to sample surface Tunable magnetic field\u00a0<strong>Range\u00a0<\/strong>: -300 ~ 300 gauss Composed of pure iron core &amp; two solenoid coils<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<h4>Dimensions in mm<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/nx10_sys_demension.jpg\" alt=\"nx10 sys demension\" \/><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx10\/nx10_ae_demension.jpg\" alt=\"nx10 ae demension\" \/><\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<div>\n<p>Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.<\/p>\n<\/div>\n","protected":false},"featured_media":1886,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[261,203],"product_tag":[],"class_list":["post-1885","product","type-product","status-publish","has-post-thumbnail","product_cat-atomic-force-microscope","product_cat-microscope","first","instock","shipping-taxable","product-type-simple"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Park NX10 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/umclbd.com\/?product=park-nx10-atomic-force-microscope\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Park NX10 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"og:description\" content=\"Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. 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