{"id":1883,"date":"2022-01-09T14:27:38","date_gmt":"2022-01-09T08:27:38","guid":{"rendered":"https:\/\/umclbd.com\/?post_type=product&#038;p=1883"},"modified":"2022-01-09T17:02:00","modified_gmt":"2022-01-09T11:02:00","slug":"park-nx12-atomic-force-microscope","status":"publish","type":"product","link":"https:\/\/umclbd.com\/?product=park-nx12-atomic-force-microscope","title":{"rendered":"Park NX12 \u2013 Atomic Force Microscope"},"content":{"rendered":"<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\">\n<div class=\"col-3_4 row-item\">\n<h2 class=\"lined\">Technical Info<\/h2>\n<div class=\"col-1 row-item\">\n<div><\/div>\n<h2>Built with multi-user facilities in mind<\/h2>\n<p>Park NX12 was built from the ground up to accommodate the needs of multi-user facilities. Other AFM solutions lack the required versatility to address the diverse needs of users in these facilities, making it difficult to justify the equipment cost. The Park NX12, however, is built to accommodate standard ambient AFM, in-liquid SPM, and optical imaging making it one of the most flexible AFMs available.<\/p>\n<p>&nbsp;<\/p>\n<h3 class=\"colored\">A modular platform for shared user facilities<\/h3>\n<div class=\"row-item\">\n<p>\u00a0\u00a0The Park NX12 is an Atomic Force Microscopy platform specifically tailored to address the needs of analytical and electrochemistry researchers as well as those working in shared-use facilities.<\/p>\n<p>It provides a versatile solution for SPM based characterization of chemical and electrochemical properties and surface characterization in both air and liquid media for a broad range of opaque and transparent materials.<\/p>\n<p>The Park NX12 is easy to use for pipette-based SPM techniques with broad visual optical access to the scanning probe.<\/p>\n<p>The Park NX12\u2019s reasonable price and unparalleled accuracy make it the ideal platform for multi-user facilities as well as early-career researchers.<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<h3 class=\"colored\">Multiple Applications<\/h3>\n<p>The Park NX12 can serve a wide range of functions, including PinPoint\u2122 in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.<\/p>\n<p>&nbsp;<\/p>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx12\/NX12-pinpoint.jpg\" alt=\"NX12-pinpoint\" \/><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx12\/NX12-SICM.jpg\" alt=\"NX12-SICM\" \/><\/p>\n<p>&nbsp;<\/p>\n<p><img decoding=\"async\" class=\"pull-right margin-30\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx12\/NX12-FD.jpg\" alt=\"NX12-FD\" \/><\/p>\n<h3 class=\"colored\">Comprehensive force spectroscopy solution<\/h3>\n<p>The Park NX12 provides a complete package for nanomechanical characterization in-liquid and in-air, making it ideal for a wide range of applications.<\/p>\n<p>&nbsp;<\/p>\n<p><img decoding=\"async\" class=\"pull-right margin-30\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx12\/NX12-Modular.jpg?v=1.3\" alt=\"NX12-Modular\" \/><\/p>\n<h3 class=\"navy\">Modular<\/h3>\n<p>We make it easy to modify the Park NX12 to suit the unique needs of your lab by installing optional hardware and software add-ons even after installation.<\/p>\n<p class=\"clear\">\n<\/div>\n<hr class=\"dashed\" \/>\n<div class=\"col-1_2 row-item\">\n<h3 class=\"skyblue\">Current-Distance(I-D) Spectroscopy<\/h3>\n<p>Acquiring the Current-Distance Curve of SICM on the way of pipette approach (vertical direction movement) toward sample surface is beneficial to elucidate various biological and chemical phenomena in an aqueous environment.<\/p>\n<p>This beneficial application can be applied to a specific and interesting object of the sample, identified with SICM\u2019s non-invasive topography. Furthermore, utilizing the \u2018current-distance curve mapping\u2019 function enables researchers to examine and acquire the current-distance curve at multiple positions so that they can reach a deeper level of understanding for biological and chemical reaction research.<\/p>\n<\/div>\n<h2><\/h2>\n<div class=\"col-1_2 row-item\"><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx10\/sicm\/SICM-i-d-spectroscopy.jpg\" alt=\"SICM-i-d-spectroscopy\" \/><\/div>\n<hr class=\"dashed\" \/>\n<div class=\"col-1 row-item\">\n<h2>Park SmartScan\u2122 makes scanning fast and simple<\/h2>\n<p>The Park NX12 is equipped with our SmartScan\u2122 OS, making it one of the easiest to use AFMs in the market. With an intuitive but extremely powerful interface, even untrained users can quickly scan a sample without supervision. This lets senior researchers focus their experience on solving bigger problems and developing better solutions.<\/p>\n<h3 class=\"colored\">Easy-to-use<\/h3>\n<p>Shared labs often have users from a wide range of backgrounds and experience levels. The NX12 can accommodate every user with its simple point and click interface and automated SmartScan\u2122 mode.<\/p>\n<\/div>\n<h2><\/h2>\n<div class=\"col-1 row-item\">\n<h3>Here is how it works after you turn on the AFM system<\/h3>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/smartscan\/smartscan-workflow.jpg\" alt=\"smartscan-workflow\" \/><\/p>\n<div>\n<h4>1. Click\u00a0<span class=\"colored\">\u201cSetup\u201d<\/span><\/h4>\n<p>A small window appears that guides you through animation on how to set the instrument and place the sample for imaging. Typically this takes only a few minutes.<\/p>\n<h4>2. Click\u00a0<span class=\"colored\">\u201cPosition\u201d<\/span><\/h4>\n<p>The system automatically performs the frequency sweep for the cantilever, approaches the Z-stage to the sample, and autofocuses the sample allowing the user to see and navigate the area of interest for imaging.<\/p>\n<h4>3. Click\u00a0<span class=\"colored\">\u201cImage\u201d<\/span><\/h4>\n<p>The system sets all the necessary parameters for optimum setting, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed.<\/p>\n<h4>End<\/h4>\n<p>The cantilever will disengage from the sample, and ready for the next sample imaging.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<div id=\"tab-feature_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--feature_tab panel entry-content wc-tab\">\n<p>&nbsp;<\/p>\n<h3 class=\"colored\">A wide range of environmental control options including versatile electrochemistry cells, temperature stage, and glovebox with humidity control.<\/h3>\n<div class=\"col-1_2 row-item\">\n<h4>\u00a0 Electrochemistry cells<\/h4>\n<p>\u2022 Electrochemistry cell \u2022 Electrochemistry toolkit for universal liquid cell<\/p>\n<h4>\u00a0 Electrochemistry options<\/h4>\n<p>\u2022 Potentiostat \u2022 Bipotentiostat<\/p>\n<h4>\u00a0 Environmental Control Options<\/h4>\n<p>\u2022 Glovebox \u2022 Live-cell chamber<\/p>\n<h4>\u00a0\u00a0Temperature Controlled Stages<\/h4>\n<p>\u2022 Temperature controlled stage (-25 ~180 \u00baC)<\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<h4>\u00a0\u00a0Z Scanner Heads<\/h4>\n<p>\u2022 15 \u03bcm Z Scanner AFM head \u2022 30 \u03bcm Z Scanner AFM head \u2022 15 \u03bcm Z Scanner SICM module \u2022 30 \u03bcm Z Scanner SICM module<\/p>\n<h4>\u00a0\u00a0In-Liquid Imaging Options<\/h4>\n<p>\u2022 Liquid probe hand \u2022 Open liquid cell \u2022 Universal liquid cell<\/p>\n<h4>\u00a0\u00a0Acoustic Enclosure<\/h4>\n<p>\u2022 Stand alone type AE 204<\/p>\n<h4>\u00a0\u00a0Clip-type Chip Carrier<\/h4>\n<p>\u2022 Can be used with an unmounted cantilever \u2022 Tip bias function available for conductive AFM and EFM \u2022 Tip bias range: -10 V ~ 10 V<\/p>\n<h4>\u00a0\u00a0Starter kits for advanced modes<\/h4>\n<p>\u2022 Easy to use for advanced modes \u2022 Includes specialized probes and samples<\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<\/div>\n<div id=\"tab-brochure_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--brochure_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<p>&nbsp;<\/p>\n<h3 class=\"select-title\">Brochures<\/h3>\n<div class=\"select\"><a href=\"http:\/\/analytical.omcbd.com\/wp-content\/uploads\/sites\/7\/2021\/03\/ParkNX12180904E12AB.pdf\">parknx12180904e12ab<\/a><\/div>\n<p>&nbsp;<\/p>\n<\/div>\n<\/div>\n<div id=\"tab-specifications_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--specifications_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<h2 class=\"lined\">Specifications<\/h2>\n<div class=\"spec b-line\">\n<h4 class=\"spec-title\">Scanner<\/h4>\n<p><strong>XY scanner range:<\/strong>\u00a0100 \u03bcm \u00d7 100 \u03bcm\u00a0<strong>AFM head Z scanner range:<\/strong>\u00a015 \u03bcm,\u00a0(optional 30 \u03bcm)\u00a0<strong>SICM head Z scanner range:<\/strong>\u00a015 \u03bcm,\u00a0(optional 30 \u03bcm)<\/p>\n<\/div>\n<div class=\"spec b-line\">\n<h4 class=\"spec-title\">Electronics<\/h4>\n<div class=\"col-helf row-item\"><strong>ADC:<\/strong>\u00a018 channels 24-bit ADCs for X, Y, and Z scanner position sensor<\/div>\n<div class=\"col-helf row-item\"><strong>DAC:<\/strong>\u00a017 channels 20-bit DACs for X, Y, and Z scanner positioning 3 channels of integrated lock-in amplifier Spring constant calibration (Thermal vibration method) Digital Q control<\/div>\n<\/div>\n<div class=\"spec-2 b-line\">\n<h4 class=\"spec-title\">AFM\/SPM Modes<\/h4>\n<p><strong>Basic modes:<\/strong>\u00a0True Non-contact\u2122 mode, Tapping mode, and Phase imaging, Contact mode and LFM, PinPoint\u2122 imaging, F\/D spectroscopy, Force volume imaging, MFM, Enhanced EFM (Basic EFM, DC-EFM, PFM, and SKPM), FMM, Nanoindentation\u00a0<strong>NX option modes:<\/strong>\u00a0C-AFM Options (Basic C-AFM, ULCA, VECA, SSRM), High Voltage option, SCM, SThM, STM<\/p>\n<\/div>\n<div class=\"spec b-line\">\n<h4 class=\"spec-title\">Vision (AFM)<\/h4>\n<div class=\"col-half row-item\"><strong>Direct on-axis vision of sample surface and cantilever\u00a0<\/strong>\u00a0<strong>Field-of-view:<\/strong>\u00a0840 \u03bcm \u00d7 630 \u03bcm (with 10\u00d7 objective lens)\u00a0<strong>Camera:<\/strong>\u00a05 M Pixel (default), 1 M Pixel (optional)<\/div>\n<div class=\"col-half row-item\"><strong>Objective lens<\/strong>\u00a010x (N. A. 0.21) ultra-long working distance lens 20x (N. A. 0.42) high-resolution, long working distance lens<\/div>\n<\/div>\n<div class=\"spec-2 b-line\">\n<h4 class=\"spec-title\">Software &#8211; Park SmartScan\u2122<\/h4>\n<p>\u2022 AFM system control and data acquisition software \u2022 Auto mode for quick setup and easy imaging \u2022 Manual mode for advanced use and finer scan control<\/p>\n<h4 class=\"spec-title\">Software &#8211; XEI<\/h4>\n<p>\u2022 AFM data analysis software \u2022 Stand-alone design\u2014can install and analyze data away from AFM \u2022 Capable of producing 3D renders of acquired data<\/p>\n<\/div>\n<div class=\"spec-2 b-line\">\n<h4 class=\"spec-title\">Inverted Optical Microscopy<\/h4>\n<p><strong>Objective lens:<\/strong>\u00a0up to 100x Fluorescence microscopy* (optional) Confocal microscopy* (optional)<\/p>\n<\/div>\n<div>\n<h4 class=\"spec-title\">GloveBox (Optional)<\/h4>\n<p>\u2022 Allows precise control over the humidity \u2022 Makeup of specified gaseous environments \u2022 Allowing you to insulate highly reactive materials<\/p>\n<\/div>\n<div>\n<div class=\"spec-2 b-line\"><\/div>\n<h4 class=\"spec-title\">Dimensions in mm<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx12\/NX12_Dimensions.jpg\" alt=\"NX12 Dimensions\" \/><\/p>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<h2>A versatile microscopy platform for analytical chemistry researchers and shared user facilities<\/h2>\n<ul class=\"b-list square m-circle i-emerald\">\n<li>Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities<\/li>\n<li>Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)<\/li>\n<li>Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration<\/li>\n<\/ul>\n","protected":false},"featured_media":1884,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[261],"product_tag":[],"class_list":["post-1883","product","type-product","status-publish","has-post-thumbnail","product_cat-atomic-force-microscope","first","instock","shipping-taxable","product-type-simple"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - 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