{"id":1881,"date":"2022-01-09T14:26:01","date_gmt":"2022-01-09T08:26:01","guid":{"rendered":"https:\/\/umclbd.com\/?post_type=product&#038;p=1881"},"modified":"2022-01-09T17:02:00","modified_gmt":"2022-01-09T11:02:00","slug":"xe15-atomic-force-microscope","status":"publish","type":"product","link":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope","title":{"rendered":"XE15 \u2013 Atomic Force Microscope"},"content":{"rendered":"<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\">\n<h2 class=\"lined\">The most convenient sample measurements with MultiSample\u2122 scan<\/h2>\n<div class=\"col-1_2 row-item\">\n<h3>Park XE15 MultiSample\u2122 scan system<\/h3>\n<ul class=\"b-list iconok m-circle\">\n<li>Automated imaging of multiple samples in one pass<\/li>\n<li>Specially designed multi-sample chuck for the loading of up to 16 individual samples<\/li>\n<li>Fully motorized XY sample stage travels up to 150 mm x 150 mm<\/li>\n<\/ul>\n<p>Using the motorized sample stage, MultiSample Scan\u2122 enables programmable multiple region imaging in step-and-scan automation.<\/p>\n<p>Here\u2019s how it works:<br \/>\n1. Register multiple scan positions defined by a user<br \/>\n2. Image from the first scan position<br \/>\n3. Lift a cantilever<br \/>\n4. Move the motorized stage to the next user-defined coordinate<br \/>\n5. Approach<br \/>\n6. Repeat scan<\/p>\n<p>The registration of multiple scan positions are easily carried out by either entering sample-stage coordinates or sample de-skewing by two reference points. This automated feature greatly increases productivity by reducing the need for your interaction during the scan process.<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\"><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe15\/tech\/xe15_afm_sys.jpg\" alt=\"xe15 afm sys\" \/><\/div>\n<div class=\"d-line\"><\/div>\n<h2 class=\"lined\">Accurate XY Scan by Crosstalk Elimination<\/h2>\n<div class=\"col-1 row-item\">\n<p>Park Systems\u2019 advanced Crosstalk Elimination (XE) scan system effectively addresses all of the above-mentioned problems. In this configuration, we used a 2-dimensional flexure stage to scan the sample in only the XY direction, and a stacked piezoelectric actuator to scan the probe cantilever in the Z direction only. The flexure stage used for the XY scanner is made of solid aluminum. It demonstrates high orthogonality and an excellent out-of-plane motion profile. The flexure stage can scan large samples (~1 kg) up to a few 100 Hz in the XY direction. This scan speed is sufficient because the bandwidth requirement for the XY axes is much lower than that for the Z axis. The stacked piezoelectric actuator for the Z-scanner has a high resonance frequency (~10 kHz) with a high push-pull force when appropriately pre-loaded.<\/p>\n<\/div>\n<div class=\"gap-20\"><\/div>\n<div class=\"col-1_2 row-item v-line\">\n<h4 class=\"lined\">XE scan system<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/tech\/XE-systems.gif\" alt=\"XE-systems\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>independent, loop XY and Z flexure scanners for sample and probe tip<\/li>\n<\/ul>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\">\n<h4 class=\"lined\">XY flexure scanner<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/tech\/3img_4.gif\" alt=\"3img 4\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>Flat and orthogonal XY scan with low residual bow<\/li>\n<\/ul>\n<\/div>\n<div class=\"gap-20\"><\/div>\n<div class=\"col-1 row-item\">\n<h4 class=\"lined\">XE-Peformence<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/tech\/3img_7.gif\" alt=\"3img 7\" \/><em>Figure 9. Zero background curvature by Park Systems XE-system (a) and typical background curvature of a conventional AFM system with a tube scanner (b). (c) shows the cross-section of these background curvatures.<\/em><\/p>\n<p>Figure 9. shows unprocessed AFM images of a bare silicon wafer taken with the XE-system (a), and with a conventional AFM (b). Since the silicon wafer is atomically flat, most of the curvatures in the image are scanner-induced artifacts. Figure 9. (c) shows the cross-section of the images in Figure 9. (a) and (b). Since the tube scanner has intrinsic background curvatures, the maximum out-of-plane motion is as much as 80 nm when the X-axis moves 15 \u03bcm. The XE scan system has less than 1nm of out-of-plane motion for the same scan range. Another advantage of the XE scan system is its Z-servo response. Figure 10. is an image of a porous polymer sphere (Styrene Divinyl Benzene), whose diameter is about 5 \u00b5m, taken with the XE-system in Non-Contact mode. Since the Z-servo response of the XE-system is very accurate, the probe can precisely follow the steep curvature of the polymer sphere as well as small porous surface structures without crashing or sticking to the surface. Figure 11. shows another example that demonstrates the high performance of the z-servo response with a flat background.<\/p>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/tech\/3img_8.gif\" alt=\"3img 8\" \/><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/tech\/3img_9.gif\" alt=\"3img 9\" \/><br \/>\n<em>Figure 10. Figure 11.<\/em><\/p>\n<\/div>\n<div class=\"d-line\"><\/div>\n<h2 class=\"lined\">Better tip life, sample preservation, and accuracy with True Non-Contact\u2122 Mode<\/h2>\n<div class=\"col-1 row-item\">\n<p>In True Non-Contact\u2122 Mode, the tip-sample distance is successfully maintained at a few nanometers in the net attractive regime of inter-atomic force. The small amplitude of tip oscillation minimizes the tip-sample interaction, resulting in superb tip preservation and negligible sample modification.<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item v-line\">\n<h4 class=\"lined\">True Non-Contact\u2122 Mode<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/non-contact.jpg\" alt=\"non-contact\" \/><\/p>\n<ul class=\"b-list iconok m-circle\">\n<li>Less tip wear = Prolonged high-resolution scan<\/li>\n<li>Non-destructive tip-sample interaction = Minimized sample modification<\/li>\n<li>Immunity from parameter-dependent results<\/li>\n<\/ul>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\">\n<h4 class=\"lined\">Tapping Imaging<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/tapping-imaging.jpg\" alt=\"tapping-imaging\" \/><\/p>\n<ul class=\"b-list exclamation m-circle\">\n<li>Quick tip wear = Blurred low-resolution scan<\/li>\n<li>Destructive tip-sample interaction = Sample damage and modification<\/li>\n<li>Highly parameter-dependent<\/li>\n<\/ul>\n<\/div>\n<hr class=\"dashed\" \/>\n<div class=\"col-1\">\n<div class=\"row-item\">\n<h3>Longer Tip Life and Less Sample Damage<\/h3>\n<p>The sharp end of an AFM tip is so brittle that once it touches a sample, it becomes instantly blunt and limits the resolution of an AFM, and reduces the quality of the image. For softer samples, the tip will damage the sample and also result in inaccuracies of sample height measurements. Consequently, preserving tip integrity enables consistent high resolution and accurate data.\u00a0True Non-Contact Mode of the XE-AFM\u00a0superbly preserves the tip, resulting in\u00a0much longer tip life and less sample damage the figure, displayed in 1:1 aspect ratio, shows the unprocessed raw data image of a shallow trench isolation sample imaged by the\u00a0XE-AFM, whose depth is also confirmed by scanning electron microscope (SEM). The same tip used in the imaging of the sample shows no tip wear even after taking 20 images.\u00a0<img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/tech\/xe-afm.gif\" alt=\"xe-afm\" \/><\/p>\n<\/div>\n<\/div>\n<\/div>\n<div id=\"tab-feature_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--feature_tab panel entry-content wc-tab\">\n<p>&nbsp;<\/p>\n<div class=\"col-1 row-item\">\n<h2 class=\"lined\">he Most Extensible AFM Solution<\/h2>\n<h3>Supports Park\u2019s most extensive range of SPM modes and options in the industry<\/h3>\n<p>Today&#8217;s researchers need to characterize a wide range of physical properties under diverse measurement conditions and sample environments. Park Systems provides the most extensive range of SPM modes, the largest number of AFM options, and the best option compatibility and upgradeability in the industry for advanced sample characterization.<img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe7\/graphene-topography-spm-modes.jpg\" alt=\"graphene-topography-spm-modes\" \/><\/p>\n<p>&nbsp;<\/p>\n<\/div>\n<div class=\"d-line\"><\/div>\n<h2>Park XE15 has the most Extensive range of SPM modes (*Optionally available)<\/h2>\n<div class=\"col-1_3 row-item\">\n<h3 class=\"lined\">Standard Imaging<\/h3>\n<ul class=\"b-list b-categories\">\n<li>True Non-Contact AFM<\/li>\n<li>Basic Contact AFM<\/li>\n<li>Lateral Force Microscopy (LFM)<\/li>\n<li>Phase Imaging<\/li>\n<\/ul>\n<h3 class=\"lined\">Chemical Properties*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Chemical Force Microscopy<\/li>\n<li>Electrochemical Microscopy (EC-AFM)<\/li>\n<\/ul>\n<h3 class=\"lined\">Force Measurement*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Force Distance (FD) Spectroscopy<\/li>\n<li>Force Volume Imaging<\/li>\n<\/ul>\n<\/div>\n<div class=\"col-1_3 row-item\">\n<h3 class=\"lined\">Electrical Properties*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Conductive AFM<\/li>\n<li>I-V Spectroscopy<\/li>\n<li>Kelvin Probe Force Microscopy (KPFM)<\/li>\n<li>Scanning Capacitance Microscopy (SCM)<\/li>\n<li>Scanning Spreading-Resistance Microscopy (SSRM)<\/li>\n<li>Scanning Tunneling Microscopy (STM)<\/li>\n<li>Time-Resolved Photo Current Mapping (PCM)<\/li>\n<\/ul>\n<h3 class=\"lined\">Magnetic Properties*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Magnetic Force Microscopy (MFM)<\/li>\n<\/ul>\n<\/div>\n<div class=\"col-1_3 row-item\">\n<h3 class=\"lined\">Dielectric\/Piezoelectric Properties*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Electrostatic Force Microscopy (EFM)<\/li>\n<li>Dynamic Contact EFM (EFM-DC)<\/li>\n<li>Piezoelectric Force Microscopy (PFM)<\/li>\n<\/ul>\n<h3 class=\"lined\">Mechanical Properties*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Force Modulation Microscopy (FMM)<\/li>\n<li>Nanoindentation<\/li>\n<li>Nanolithography<\/li>\n<\/ul>\n<h3 class=\"lined\">Thermal Properties*<\/h3>\n<ul class=\"b-list b-categories\">\n<li>Scanning Thermal Microscopy (SThM)<\/li>\n<\/ul>\n<\/div>\n<p>&nbsp;<\/p>\n<\/div>\n<div id=\"tab-brochure_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--brochure_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<p><strong>Brochures:<\/strong>\u00a0<a href=\"http:\/\/analytical.omcbd.com\/wp-content\/uploads\/sites\/7\/2021\/03\/Park_XE15.pdf\">park_xe15<\/a><\/p>\n<\/div>\n<\/div>\n<div id=\"tab-specifications_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--specifications_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<div class=\"col-1 row-item\">\n<h2 class=\"lined\">Park XE15 Specifications<\/h2>\n<\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>XY Scanner<\/h4>\n<p>Single-module flexure XY scanner with closed-loop control\u00a0<strong>Scan range\u00a0<\/strong>: 100 \u00b5m \u00d7 100 \u00b5m<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Motorized Stage<\/h4>\n<p><strong>XY travel range\u00a0<\/strong>: 150 mm \u00d7 150 mm, motorized\u00a0<strong>Z travel range<\/strong>\u00a0: 25 mm\u00a0<strong>Focus travel range<\/strong>\u00a0: 20 mm, motorized Optional precision encoders for repeatable XY positioning<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Z Scanner<\/h4>\n<p>Guided high-force Z scanner\u00a0<strong>Scan range\u00a0<\/strong>: 12 \u00b5m 25 \u00b5m (optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Sample Mount<\/h4>\n<p><strong>Sample size\u00a0<\/strong>: Up to 150 mm\u00a0<strong>Thickness\u00a0<\/strong>: Up to 20 mm<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Vision<\/h4>\n<p>Direct on-axis vision of sample surface and cantilever Coupled with 10\u00d7 objective lens (20\u00d7 optional)\u00a0<strong>Field-of-view<\/strong>: 480 \u00d7 360 \u00b5m\u00a0<strong>CCD<\/strong>: 1 Mpixel<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Software<\/h4>\n<h4>XEP<\/h4>\n<p>Dedicated system control and data acquisition software Adjusting feedback parameters in real-time Script-level control through external programs(optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>XEI<\/h4>\n<p>AFM data analysis software (running on Windows, macOS X, and Linux)<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Electronics<\/h4>\n<p><strong>High performance DSP<\/strong>\u00a0: 600 MHz with 4800 MIPS Maximum 16 data images\u00a0<strong>Maximum data size\u00a0<\/strong>: 4096 \u00d7 4096 pixels\u00a0<strong>Signal inputs\u00a0<\/strong>: 20 channels of 16 bit ADC at 500 kHz samplings\u00a0<strong>Signal outputs\u00a0<\/strong>: 21 channels of 16 bit DAC at 500 kHz settling\u00a0<strong>Synchronous signal\u00a0<\/strong>: End-of-image, end-of-line, and end-of-pixel TTL signals Active Q control (optional) Cantilever spring constant calibration (optional) CE Compliant\u00a0<strong>Power<\/strong>: 120 W Signal Access Module (Optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>AFM Modes (*Optionally available)<\/h4>\n<h4>Standard Imaging<\/h4>\n<p>True Non-Contact AFM Basic Contact AFM Lateral Force Microscopy\u00a0(LFM) Phase Imaging Intermittent (tapping) AFM<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Force Measurement*<\/h4>\n<p>Force Distance (FD) Spectroscopy Force Volume Imaging<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Dielectric\/Piezoelectric Properties*<\/h4>\n<p>Electric Force Microscopy (EFM) Dynamic Contact EFM (EFM-DC) Piezoelectric Force Microscopy (PFM) PFM with High Voltage<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Mechanical Properties*<\/h4>\n<p>Force Modulation Microscopy (FMM) Nanoindentation Nanolithography Nanolithography with High Voltage Nanomanipulation Piezoelectric Force Microscopy (PFM)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Magnetic Properties*<\/h4>\n<p>Magnetic Force Microscopy (MFM)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Electrical Properties*<\/h4>\n<p>Conductive AFM IV Spectroscopy Kelvin Probe Force Microscopy (KPFM) KPFM with High Voltage Scanning Capacitance Microscopy (SCM) Scanning Spreading-Resistance Microscopy (SSRM) Scanning Tunneling Microscopy (STM) Time-Resolved Photo Current Mapping (PCM)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Chemical Properties*<\/h4>\n<p>Chemical Force Microscopy with Functionalized Tip Electrochemical Microscopy (EC-AFM)<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<h4>AFM Options<\/h4>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4 class=\"margin-20\">Active Temperature-controlled Acoustic Enclosure<\/h4>\n<p>Innovative control brings the system quickly to its temperature equilibrium Temperature stability of less than 0.05 \u00baC within10 minutes of closing AE door Includes an active vibration isolation system<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4 class=\"margin-20\">Encoders for Motorized Stage<\/h4>\n<p>The encoded XY stage travels in 1 \u00b5m resolution with 2 \u00b5m repeatability The encoded Z stage travels in 0.1 \u00b5m resolution with 1 \u00b5m repeatability<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Sample Plates<\/h4>\n<p>Vacuum grooves to hold wafers\u00a0<strong>Sample dimension<\/strong>: Up to 150 mm<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>25 \u00b5m Z-scanner Head<\/h4>\n<p><strong>Z scan range<\/strong>: 25 \u00b5m\u00a0<strong>Resonant frequency<\/strong>: 1.7 kHz\u00a0<strong>Laser type<\/strong>: LD (650 nm) or SLD (830 nm)\u00a0<strong>Noise floor\u00a0<\/strong>: 0.03 nm (typical), 0.05 nm (maximum)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>XE Optical Head<\/h4>\n<p><strong>Optical access<\/strong>: top and side\u00a0<strong>Z scan range<\/strong>: 12 \u00b5m or 25 \u00b5m\u00a0<strong>Laser type\u00a0<\/strong>: LD (650 \u00b5m) or SLD (830 \u00b5m)\u00a0<strong>Noise floor\u00a0<\/strong>: 0.03 nm (typical), 0.05 nm (maximum)\u00a0<strong>Resonant frequency\u00a0<\/strong>: 3 kHz (12 \u00b5m XE Head), 1.7 kHz (25 \u00b5m XE Head)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Clip-type Probehand<\/h4>\n<p>Unmounted cantilever can be used\u00a0<strong>Tip bias range\u00a0<\/strong>: -10 V to + 10 V Tip bias function available for EFM and Conductive AFM Support all the standard and advanced modes but STM, SCM, and in-liquid imaging<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Signal Access Module (SAM)<\/h4>\n<p>Enables access to various input\/output signals for AFM Scanner driving signal for the XY and Z scanners Position signal for the XY and Z scanners Cantilever deflection signals of the vertical\/lateral direction Bias signal for the sample and the cantilever Driving signal for XE15 Auxiliary input signal to the system<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Accessories<\/h4>\n<p>Electrochemistry Cell Universal Liquid Cell with Temperature Control Sample Stages with Temperature Control Magnetic Field Generator<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<h4>Dimensions in mm<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/xe15\/xe15_demensions.jpg\" alt=\"xe15 demensions\" \/><\/p>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<div>\n<h2>Increase your productivity with our powerfully versatile atomic force microscope<\/h2>\n<p>The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi-variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.<\/p>\n<\/div>\n","protected":false},"featured_media":1882,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[261],"product_tag":[],"class_list":["post-1881","product","type-product","status-publish","has-post-thumbnail","product_cat-atomic-force-microscope","first","instock","shipping-taxable","product-type-simple"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>XE15 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"XE15 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"og:description\" content=\"Increase your productivity with our powerfully versatile atomic force microscope The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi-variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope\" \/>\n<meta property=\"og:site_name\" content=\"umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/the.umclbd\" \/>\n<meta property=\"article:modified_time\" content=\"2022-01-09T11:02:00+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png\" \/>\n\t<meta property=\"og:image:width\" content=\"485\" \/>\n\t<meta property=\"og:image:height\" content=\"360\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"7 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope\",\"url\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope\",\"name\":\"XE15 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited\",\"isPartOf\":{\"@id\":\"https:\/\/umclbd.com\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#primaryimage\"},\"image\":{\"@id\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#primaryimage\"},\"thumbnailUrl\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png\",\"datePublished\":\"2022-01-09T08:26:01+00:00\",\"dateModified\":\"2022-01-09T11:02:00+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#primaryimage\",\"url\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png\",\"contentUrl\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png\",\"width\":485,\"height\":360},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/umclbd.com\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Product\",\"item\":\"https:\/\/umclbd.com\/?page_id=78\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"XE15 \u2013 Atomic Force Microscope\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/umclbd.com\/#website\",\"url\":\"https:\/\/umclbd.com\/\",\"name\":\"umclbd.com | United Marketing Company Limited\",\"description\":\"Importer, Suppliers and Seller of Scientific Instruments, Medical Equipment\u2019s, Laboratory-Chemicals, Reagents, Glassware, Pharmaceuticals Raw, Q.C Materials etc.\",\"publisher\":{\"@id\":\"https:\/\/umclbd.com\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/umclbd.com\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/umclbd.com\/#organization\",\"name\":\"United Marketing Company Limited\",\"url\":\"https:\/\/umclbd.com\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/umclbd.com\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2021\/11\/logo-1.png\",\"contentUrl\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2021\/11\/logo-1.png\",\"width\":427,\"height\":143,\"caption\":\"United Marketing Company Limited\"},\"image\":{\"@id\":\"https:\/\/umclbd.com\/#\/schema\/logo\/image\/\"},\"sameAs\":[\"https:\/\/www.facebook.com\/the.umclbd\"]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"XE15 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope","og_locale":"en_US","og_type":"article","og_title":"XE15 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited","og_description":"Increase your productivity with our powerfully versatile atomic force microscope The Park XE15 includes many unique capabilities that make it ideal for shared labs that handle a diverse range of samples, researchers doing multi-variant experiments, and failure analysis engineers working on wafers. Its reasonable price and robust feature set also make it one of the best value large-sample AFMs in the industry.","og_url":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope","og_site_name":"umclbd.com | United Marketing Company Limited","article_publisher":"https:\/\/www.facebook.com\/the.umclbd","article_modified_time":"2022-01-09T11:02:00+00:00","og_image":[{"width":485,"height":360,"url":"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png","type":"image\/png"}],"twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"7 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope","url":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope","name":"XE15 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited","isPartOf":{"@id":"https:\/\/umclbd.com\/#website"},"primaryImageOfPage":{"@id":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#primaryimage"},"image":{"@id":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#primaryimage"},"thumbnailUrl":"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png","datePublished":"2022-01-09T08:26:01+00:00","dateModified":"2022-01-09T11:02:00+00:00","breadcrumb":{"@id":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#primaryimage","url":"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png","contentUrl":"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/XE15.png","width":485,"height":360},{"@type":"BreadcrumbList","@id":"https:\/\/umclbd.com\/?product=xe15-atomic-force-microscope#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/umclbd.com\/"},{"@type":"ListItem","position":2,"name":"Product","item":"https:\/\/umclbd.com\/?page_id=78"},{"@type":"ListItem","position":3,"name":"XE15 \u2013 Atomic Force Microscope"}]},{"@type":"WebSite","@id":"https:\/\/umclbd.com\/#website","url":"https:\/\/umclbd.com\/","name":"umclbd.com | United Marketing Company Limited","description":"Importer, Suppliers and Seller of Scientific Instruments, Medical Equipment\u2019s, Laboratory-Chemicals, Reagents, Glassware, Pharmaceuticals Raw, Q.C Materials etc.","publisher":{"@id":"https:\/\/umclbd.com\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/umclbd.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/umclbd.com\/#organization","name":"United Marketing Company Limited","url":"https:\/\/umclbd.com\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/umclbd.com\/#\/schema\/logo\/image\/","url":"https:\/\/umclbd.com\/wp-content\/uploads\/2021\/11\/logo-1.png","contentUrl":"https:\/\/umclbd.com\/wp-content\/uploads\/2021\/11\/logo-1.png","width":427,"height":143,"caption":"United Marketing Company Limited"},"image":{"@id":"https:\/\/umclbd.com\/#\/schema\/logo\/image\/"},"sameAs":["https:\/\/www.facebook.com\/the.umclbd"]}]}},"_links":{"self":[{"href":"https:\/\/umclbd.com\/index.php?rest_route=\/wp\/v2\/product\/1881","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/umclbd.com\/index.php?rest_route=\/wp\/v2\/product"}],"about":[{"href":"https:\/\/umclbd.com\/index.php?rest_route=\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/umclbd.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=1881"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/umclbd.com\/index.php?rest_route=\/wp\/v2\/media\/1882"}],"wp:attachment":[{"href":"https:\/\/umclbd.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=1881"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/umclbd.com\/index.php?rest_route=%2Fwp%2Fv2%2Fproduct_brand&post=1881"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/umclbd.com\/index.php?rest_route=%2Fwp%2Fv2%2Fproduct_cat&post=1881"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/umclbd.com\/index.php?rest_route=%2Fwp%2Fv2%2Fproduct_tag&post=1881"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}