{"id":1879,"date":"2022-01-09T14:23:39","date_gmt":"2022-01-09T08:23:39","guid":{"rendered":"https:\/\/umclbd.com\/?post_type=product&#038;p=1879"},"modified":"2022-01-09T17:02:01","modified_gmt":"2022-01-09T11:02:01","slug":"nx20-atomic-force-microscope","status":"publish","type":"product","link":"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope","title":{"rendered":"NX20 \u2013 Atomic Force Microscope"},"content":{"rendered":"<div id=\"tab-description\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--description panel entry-content wc-tab\">\n<h2 class=\"lined\">Accurate AFM Solutions for FA and Research Laboratories<\/h2>\n<div class=\"col-1 row-item\">\n<h3>Sidewall measurements for 3D structure study<\/h3>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/3D-wall.jpg\" alt=\"3D-wall\" \/>The NX20\u2019s innovative architecture lets you detect the sidewall and surface of the sample, and measure their angle. This gives the unit the versatility you need to do more innovative research and gain deeper insights.<\/p>\n<\/div>\n<hr class=\"dashed\" \/>\n<h3>Surface roughness measurements for media and substrates<\/h3>\n<div class=\"col-1_2 row-item\">Surface roughness is one of the key applications where Park NX20 can excel and deliver the accurate failure analysis and quality assurance.<br \/>\n<i class=\"icon-external-link\">\u00a0\u00a0<\/i>Read More related application<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\"><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/surface-roughness.jpg\" alt=\"surface-roughness\" \/><\/div>\n<hr class=\"dashed\" \/>\n<div class=\"col-1 row-item\">\n<h3>High resolution electrical scan mode<\/h3>\n<div><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/tech-quickstep.jpg\" alt=\"tech-quickstep\" \/><\/div>\n<p><strong>QuickStep SCM<\/strong><br \/>\nThe Fastest Scanning Capacitance Microscopy<\/p>\n<p><strong>PinPoint AFM<\/strong><br \/>\nThe Frictionless Conductive AFM<\/p>\n<p><i class=\"icon-external-link\">\u00a0\u00a0<\/i>Read More related AFM Modes<\/p>\n<\/div>\n<div class=\"d-line\"><\/div>\n<h2 class=\"lined\">Accurate and Reproducible Measurements for Better Productivity<\/h2>\n<h3>Tip lifetime performance data on polished silicon wafer: 15,000 scans @ 10Hz using 1 tip!<\/h3>\n<div class=\"col-1_2 row-item\">\n<h3>Reproduce Best AFM Measurement<\/h3>\n<p>True Non-Contact Mode preserves the sharp tip end even after imaging 200 images of CrN, so-called tip check sample. CrN has a very abrasive surface that may quickly wear out the sharp tip.<\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\"><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/tech\/ETD-Non-Contact.jpg\" alt=\"ETD-Non-Contact\" \/><\/div>\n<div class=\"d-line\"><\/div>\n<h2 class=\"lined\">Accurate AFM Topography with Low Noise Z Detector<\/h2>\n<div class=\"col-1 row-item\">\n<h4>True Sample Topography\u2122 without piezo creep error<\/h4>\n<p>Our AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of .02 nm over large bandwidth. This produces highly accurate sample topography, no edge overshoot and no need for calibration. Just one of the many ways Park AFM saves your time and gives you better data.<\/p>\n<ul class=\"b-list iconok m-circle col-1_2\">\n<li>Low noise Z detector signal is used for topography<\/li>\n<li>Low Z detector noise of 0.02 nm over a large bandwidth<\/li>\n<\/ul>\n<ul class=\"b-list iconok m-circle col-1_2\">\n<li>No edge overshoot at the leading and trailing edges<\/li>\n<li>Calibration needs to be done only once at the factory<\/li>\n<\/ul>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item v-line\">\n<h4 class=\"lined\">Park NX AFM<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/no-creep-effect.jpg\" alt=\"no-creep-effect\" \/><\/p>\n<\/div>\n<p>&nbsp;<\/p>\n<div class=\"col-1_2 row-item\">\n<h4 class=\"lined\">Conventional AFM<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/creep-effect.jpg\" alt=\"creep-effect\" \/><\/p>\n<\/div>\n<div class=\"gap-30\"><\/div>\n<\/div>\n<div id=\"tab-brochure_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--brochure_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<p><strong>Brochures:<\/strong><\/p>\n<p><a href=\"http:\/\/analytical.omcbd.com\/wp-content\/uploads\/sites\/7\/2021\/03\/Park_NX20.pdf\">park_nx20<\/a><\/p>\n<\/div>\n<\/div>\n<div id=\"tab-specifications_tab\" class=\"woocommerce-Tabs-panel woocommerce-Tabs-panel--specifications_tab panel entry-content wc-tab\">\n<div id=\"soft-download\">\n<div class=\"col-1 row-item\">\n<h2 class=\"lined\">Park NX20 Specification<\/h2>\n<\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>XY Scanner<\/h4>\n<p>Single-module flexure XY scanner with closed-loop control Scan range\u00a0: 100\u03bcm x 100\u03bcm 50\u03bcm x 50\u03bcm 25\u03bcm x 25\u03bcm 20-bit position control and 24-bit position sensor<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Stage<\/h4>\n<p>XY travel range\u00a0: 150 mm (200 mm optional) Z travel range\u00a0: 25 mm Focus travel range: 15 mm Precision encoder for all axes (optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Z Scanner<\/h4>\n<p>Guided high-force Z scanner Scan range\u00a0: 15 \u00b5m 30 \u00b5m 20-bit position control and 24-bit position sensor<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Sample Mount<\/h4>\n<p>Up to 150 mm (200 mm optional) Vacuum grooves to hold wafer samples<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Vision<\/h4>\n<h4>Objective lens<\/h4>\n<p>10\u00d7 (0.21 NA) objective lens with ultra-long working distance 20\u00d7 (0.42 NA)\u00a0objective lens with long working distance and high resolution Direct on-axis vision of sample surface and cantilever Coupled with 10\u00d7 objective lens (20\u00d7 optional) Field-of-view: 840 \u00b5m \u00d7 630 \u00b5m CCD: 5 MP<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>Software<\/h4>\n<h4>SmartScan\u2122<\/h4>\n<p>Dedicated system control and data acquisition software Adjusting feedback parameters in real time Script-level control through external programs(optional)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>XEI<\/h4>\n<p>AFM data analysis software<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Electronics<\/h4>\n<h4>Signal processing<\/h4>\n<p><strong>ADC<\/strong>\u00a0: 18 channels 4 high-speed ADC channels 24-bit ADCs for X, Y, and Z scanner position sensor\u00a0<strong>DAC<\/strong>\u00a0: 17 channels 2 high-speed DAC channels 20-bit DACs for X,Y and Z scanner positioning\u00a0<strong>Maximum data size<\/strong>\u00a0: 4096 x 4096 pixels<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Integrated functions<\/h4>\n<p>3 channels of flexible digital lock-in amplifier Digital Q control<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1 row-item\">\n<div>\n<h4>External signal access<\/h4>\n<p>20 embedded signal input\/output ports\u00a0<strong>5 TTL<\/strong>\u00a0<strong>outputs<\/strong>\u00a0: EOF, EOL, EOP,Modulationand AC bias<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>AFM Mode (*Optionally available)<\/h4>\n<h4>Standard Imaging<\/h4>\n<p>True Non-Contact Mode PinPoint\u2122 AFM Basic Contact AFM Lateral Force Microscopy (LFM) Phase Imaging Intermittent (tapping) AFM<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>Electrical Characterization*<\/h4>\n<p>Scanning Capacitance Microscopy (SCM) Conductive AFM Electric Force Microscopy (EFM) Piezoresponse Force Microscopy (PFM) Kelvin Probe Microscopy (KPFM)<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4>General Characterization*<\/h4>\n<p>Magnetic Force Microscopy(MFM) Scanning Thermal Microscopy(SThM) F-D Spectroscopy Scanning Tunneling Microscopy(STM) Force Modulation Microscopy(FMM) Nanoindentation Nanolithography Nanomanipulation<\/p>\n<\/div>\n<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<h4>Options<\/h4>\n<p class=\"normal\">Customize your AFM to handle any project<\/p>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>\n<h4 class=\"margin-20\">Automatic data collection and analysis lets you save time<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/option-automatic-data.jpg\" alt=\"option-automatic-data\" \/>\u00a0The NX20 features Park&#8217;s automation control software that automatically carries out AFM measurements of a sample according to your preset procedure (recipe). It can accurately collect data, perform pattern recognition, and do analysis using its onboard Cognex board and optics module, and export with almost no user in put so you have more time to do innovative research.<\/p>\n<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\">\n<div>Sample Tilting Stage for Sidewall Imaging lets you see more\u00a0<img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/menu\/products\/nx20\/option-sidewall.jpg\" alt=\"option-sidewall\" \/>\u00a0The NX20\u2019s innovative architecture lets you detect the sidewall and surface of the sample, and measure their angle. This gives the unit the versatility you need to do more innovative research and gain deeper insights.<\/div>\n<\/div>\n<div class=\"col-1_2 row-item\"><strong>Active Temperature Controlled Acoustic Enclosure\u00a0<\/strong>Innovative control design allows Park NX20 to quickly reach temperature equilibrium Innovative control design allows Park NX20 to quickly reach temperature equilibrium Park NX20 also features active vibration isolation.<strong>\u00a0<\/strong>Encoders for Motorized Stage \u2022 The encoded XY stage travels in 1 \u00b5m resolution with 2 \u00b5m repeatability \u2022 The encoded Z stage travels in 0.1 \u00b5m resolution with 1 \u00b5m repeatability<\/div>\n<div class=\"col-1_2 row-item\">Sample Plates \u2022 Dedicated small sample holder for electrical measurements \u2022 Vacuum grooves to hold wafers \u2022 Sample dimension: Up to 200 mm (150 mm default) Cliptype Chip Carrier \u2022 Can be used with an unmounted cantilever \u2022 Tip bias function available for Conductive AFM and EFM \u2022 Tip bias range: -10 V ~ +10 V Precise Temperature Control \u2022 Heating &amp; Cooling Stage (0~180 \u00baC) \u2022 250 \u00baC Heating Stage \u2022 600 \u00baC Heating Stage<\/div>\n<div class=\"s-line\"><\/div>\n<div class=\"col-1 row-item\">\n<h4>Dimensions in mm<\/h4>\n<p><img decoding=\"async\" src=\"https:\/\/www.parksystems.com\/images\/products\/nx20\/AE-demensions.jpg\" alt=\"demensions\" \/><\/p>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<h2>The leading nanometrology tool for failure analysis and large sample research<\/h2>\n<p>As an FA engineer, you\u2019re expected to deliver results. There\u2019s no room for error in the data provided by your instruments. Park NX20, with its reputation as the world\u2019s most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.<\/p>\n","protected":false},"featured_media":1880,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[261],"product_tag":[],"class_list":["post-1879","product","type-product","status-publish","has-post-thumbnail","product_cat-atomic-force-microscope","first","instock","shipping-taxable","product-type-simple"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>NX20 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"NX20 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"og:description\" content=\"The leading nanometrology tool for failure analysis and large sample research As an FA engineer, you\u2019re expected to deliver results. 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Park NX20, with its reputation as the world\u2019s most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope\" \/>\n<meta property=\"og:site_name\" content=\"umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/the.umclbd\" \/>\n<meta property=\"article:modified_time\" content=\"2022-01-09T11:02:01+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/park-nx20.png\" \/>\n\t<meta property=\"og:image:width\" content=\"485\" \/>\n\t<meta property=\"og:image:height\" content=\"360\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"4 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope\",\"url\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope\",\"name\":\"NX20 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited\",\"isPartOf\":{\"@id\":\"https:\/\/umclbd.com\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope#primaryimage\"},\"image\":{\"@id\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope#primaryimage\"},\"thumbnailUrl\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/park-nx20.png\",\"datePublished\":\"2022-01-09T08:23:39+00:00\",\"dateModified\":\"2022-01-09T11:02:01+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope#primaryimage\",\"url\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/park-nx20.png\",\"contentUrl\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/park-nx20.png\",\"width\":485,\"height\":360},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/umclbd.com\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Product\",\"item\":\"https:\/\/umclbd.com\/?page_id=78\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"NX20 \u2013 Atomic Force Microscope\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/umclbd.com\/#website\",\"url\":\"https:\/\/umclbd.com\/\",\"name\":\"umclbd.com | United Marketing Company Limited\",\"description\":\"Importer, Suppliers and Seller of Scientific Instruments, Medical Equipment\u2019s, Laboratory-Chemicals, Reagents, Glassware, Pharmaceuticals Raw, Q.C Materials etc.\",\"publisher\":{\"@id\":\"https:\/\/umclbd.com\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/umclbd.com\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/umclbd.com\/#organization\",\"name\":\"United Marketing Company Limited\",\"url\":\"https:\/\/umclbd.com\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/umclbd.com\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2021\/11\/logo-1.png\",\"contentUrl\":\"https:\/\/umclbd.com\/wp-content\/uploads\/2021\/11\/logo-1.png\",\"width\":427,\"height\":143,\"caption\":\"United Marketing Company Limited\"},\"image\":{\"@id\":\"https:\/\/umclbd.com\/#\/schema\/logo\/image\/\"},\"sameAs\":[\"https:\/\/www.facebook.com\/the.umclbd\"]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"NX20 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/umclbd.com\/?product=nx20-atomic-force-microscope","og_locale":"en_US","og_type":"article","og_title":"NX20 \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited","og_description":"The leading nanometrology tool for failure analysis and large sample research As an FA engineer, you\u2019re expected to deliver results. 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