{"id":1877,"date":"2022-01-09T14:17:57","date_gmt":"2022-01-09T08:17:57","guid":{"rendered":"https:\/\/umclbd.com\/?post_type=product&p=1877"},"modified":"2022-01-09T17:02:01","modified_gmt":"2022-01-09T11:02:01","slug":"park-nx20-300mm-atomic-force-microscope","status":"publish","type":"product","link":"https:\/\/umclbd.com\/?product=park-nx20-300mm-atomic-force-microscope","title":{"rendered":"Park-NX20 300mm \u2013 Atomic Force Microscope"},"content":{"rendered":"
\n

Specifically Built for Large Sample Wafer Inspection<\/h3>\n

The NX20 300 mm was designed from the ground up to allow for optimal measurements of large samples. The entire 300 mm wafer area can be analyzed for low-noise AFM measurements. This opens up a whole new scope of measurement automation, allowing engineers to work faster, more simply, and with greater precision.<\/p>\n

 <\/p>\n

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\"nx20-300mm-sample-chuck\"<\/div>\n
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Flexible 300 mm Sample Chuck<\/h4>\n

The Park NX20 300 mm\u2019s vacuum chuck supports a wide range of wafer sizes, shapes, and types allowing users to accurately scan practically any sample.<\/p>\n<\/div>\n<\/div>\n

 <\/p>\n

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300 mm XY stage<\/h4>\n

The motorized 300 mm XY stage allows users to move the AFM measuring position within the entire 300 mm area.<\/p>\n<\/div>\n

\"nx20-300mm-sample-chuck-2\"<\/div>\n<\/div>\n

\"nx20_300mm\"<\/p>\n

<\/div>\n

Proven NX20 Performance with a 300 mm sample stage<\/h3>\n

The NX20 is already the best choice for FA, QA, and QC engineers that need its unparalleled ease of use and automation without compromising on accuracy. With its enlarged platform that supports a 300mm motorized XY stage, the NX20 300 mm takes this a step further, allowing users to inspect larger samples easily and with extremely high accuracy.<\/p>\n

\"nx20-300mm-high-accuracy\"<\/p>\n

<\/div>\n

Park SmartScan\u2122 makes getting accurate measurements simple<\/h3>\n
\n
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The Park NX20 is equipped with our SmartScan OS, making it one of the easiest to use AFMs on the market. With an intuitive but extremely powerful interface, even untrained users can quickly scan a large sample without supervision. This lets senior engineers focus their experience on solving bigger problems and developing better solutions.<\/p>\n<\/div>\n

\"smartscan\"<\/div>\n<\/div>\n

 <\/p>\n

\"nx20-smartscan\"<\/p>\n

 <\/p>\n

a<\/span>Scan multiple sites on the entire 300 mm wafer<\/h4>\n

SmartScan\u2019s program mode allows users to take automated sequential site measurements, compare surface morphologies, height, surface roughness from site-to-site and sample-to-sample using grid and wafer based modes. This can greatly improve user-convenience and productivity when scanning large samples.<\/p>\n

b<\/span>Powerful recipe creation<\/h4>\n

Our simple recipe creation process allows engineers to set presets defined by location, name, number and type on each batch.<\/p>\n

<\/div>\n

Optimized for a Wide Range of Applications<\/h3>\n

The NX20 300mm provides recipe-automated AFM measurement for numerous applications providing advanced measurements and analysis of samples at the nanoscale. With the ability to measure roughness, height and depth, perform defect reviews, electrical and magnetic failure analyses, thermal property characterization, and nanomechanical property imaging, the AFM is ideally suited to a wide range of tasks performed by FA, QA, and QC engineers that work with large samples.<\/p>\n

 <\/p>\n

\"optimized-wide-range\"<\/p>\n

 <\/p>\n<\/div>\n

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 <\/p>\n

Brochures:<\/h3>\n

parknx20_300mm_180109e04ab<\/a><\/p>\n<\/div>\n<\/div>\n

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Specification<\/h2>\n
\n

Scanner<\/h4>\n

XY scanner:<\/strong>\u00a0100 \u03bcm \u00d7 100 \u03bcm\u00a0Z scanner:<\/strong>\u00a015 \u03bcm, (30 \u03bcm optional)*<\/p>\n<\/div>\n

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Stage<\/h4>\n

XY travel range:<\/strong>\u00a0300 mm x 300 mm\u00a0Z travel range:<\/strong>\u00a025 mm\u00a0Focus travel range:<\/strong>\u00a08 mm\u00a0Precision encoder for all axes* (optional)<\/strong><\/p>\n<\/div>\n

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Electronics<\/h4>\n

ADC:<\/strong>\u00a018 channels 4 high-speed ADC channels (50 MSPS) 24-bit ADCs for X, Y, and Z position sensor\u00a0DAC:<\/strong>\u00a017 channels 2 high-speed DAC channels (50 MSPS) 20-bit DACs for X, Y, and Z positioning 3 channels of integrated lock-in amplifier<\/p>\n<\/div>\n

\n

Vision<\/h4>\n

Direct on-axis vision of sample and cantilever<\/strong>\u00a0Coupled with 10x objective lens (20x optional)*<\/strong>\u00a0Field-of-view:<\/strong>\u00a0480 x 360 \u03bcm\u00a0CCD:<\/strong>\u00a0up to 5Mpixel<\/p>\n<\/div>\n

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Sample Mount & Size<\/h4>\n

Vaccum groove holder:<\/strong>\u00a0100, 150, 200, 300 mm wafers, small sample Magnetic sample holder Up to 20 mm thickness<\/p>\n<\/div>\n

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Physical Information<\/h4>\n

Dimension:<\/strong>\u00a01220 mm (W) \u00d7 1170 mm (D) \u00d7 1470 mm (H)<\/p>\n<\/div>\n

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Software Park SmartScan<\/h4>\n

AFM system control and data acquisition software<\/strong>\u00a0Auto mode, Manual mode<\/strong>\u00a0Program mode for recipe-automated, sequential multiple-site measurement AFM operation<\/strong><\/p>\n<\/div>\n

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Options\/Modes*<\/h4>\n

Various options are available for wide range applications<\/strong><\/p>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

The leading automated nanometrology tool for
\n300 mm wafer measurement and analysis<\/h2>\n
\n
\n

The Park NX20 300mm is the industry\u2019s first large-sample AFM that supports a full motorized traveling range of 300 mm x 300 mm. Designed for failure analysis and quality control laboratories, the new upgraded Park NX20 system can inspect an entire 300 mm wafer efficiently, without any need for cumbersome sample displacement. Despite the enlarged platform to support the 300 mm motorized XY stage, Park\u2019s innovative vibration isolation technology keeps the system noise level below 0.5 angstroms (\u00c5) RMS or typically 0.3 \u00c5 RMS<\/p>\n<\/div>\n

in the field. Proven AFM performance and SingleClick-AFM automation eliminate any need for sample adjustment and make Park NX20 the scanning process as efficient and user-friendly as possible. With our \u201cProgram Mode,\u201d interface users can easily implement reliable and repeatable sequential multiple-site measurements over the entire 300mm x 300mm area. This makes the NX20 300 mm the premiere choice for FA, QA, and QC engineers that need to scan large samples.<\/div>\n<\/div>\n","protected":false},"featured_media":1878,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[261],"product_tag":[],"class_list":["post-1877","product","type-product","status-publish","has-post-thumbnail","product_cat-atomic-force-microscope","first","instock","shipping-taxable","product-type-simple"],"yoast_head":"\nPark-NX20 300mm \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/umclbd.com\/?product=park-nx20-300mm-atomic-force-microscope\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Park-NX20 300mm \u2013 Atomic Force Microscope - umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"og:description\" content=\"The leading automated nanometrology tool for 300 mm wafer measurement and analysis The Park NX20 300mm is the industry\u2019s first large-sample AFM that supports a full motorized traveling range of 300 mm x 300 mm. Designed for failure analysis and quality control laboratories, the new upgraded Park NX20 system can inspect an entire 300 mm wafer efficiently, without any need for cumbersome sample displacement. Despite the enlarged platform to support the 300 mm motorized XY stage, Park\u2019s innovative vibration isolation technology keeps the system noise level below 0.5 angstroms (\u00c5) RMS or typically 0.3 \u00c5 RMS in the field. Proven AFM performance and SingleClick-AFM automation eliminate any need for sample adjustment and make Park NX20 the scanning process as efficient and user-friendly as possible. With our \u201cProgram Mode,\u201d interface users can easily implement reliable and repeatable sequential multiple-site measurements over the entire 300mm x 300mm area. This makes the NX20 300 mm the premiere choice for FA, QA, and QC engineers that need to scan large samples.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/umclbd.com\/?product=park-nx20-300mm-atomic-force-microscope\" \/>\n<meta property=\"og:site_name\" content=\"umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/the.umclbd\" \/>\n<meta property=\"article:modified_time\" content=\"2022-01-09T11:02:01+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/umclbd.com\/wp-content\/uploads\/2022\/01\/NX20-300mm.png\" \/>\n\t<meta property=\"og:image:width\" content=\"533\" \/>\n\t<meta property=\"og:image:height\" content=\"320\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/umclbd.com\/?product=park-nx20-300mm-atomic-force-microscope\",\"url\":\"https:\/\/umclbd.com\/?product=park-nx20-300mm-atomic-force-microscope\",\"name\":\"Park-NX20 300mm \u2013 Atomic Force Microscope - 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