{"id":1875,"date":"2022-01-09T14:15:43","date_gmt":"2022-01-09T08:15:43","guid":{"rendered":"https:\/\/umclbd.com\/?post_type=product&p=1875"},"modified":"2022-01-14T20:37:59","modified_gmt":"2022-01-14T14:37:59","slug":"nx-hivac-high-vacuum-afm","status":"publish","type":"product","link":"https:\/\/umclbd.com\/?product=nx-hivac-high-vacuum-afm","title":{"rendered":"NX-Hivac \u2013 High Vacuum AFM"},"content":{"rendered":"
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Performing Scanning Spreading Resistance Microscopy (SSRM) measurements under high-vacuum conditions can reduce the required tip-sample interaction force, which can significantly reduce damage to both the sample and the tip. This will extend the life of each tip, making scanning cheaper and more convenient, and can provide more accurate results by improving spatial resolution and signal-to-noise ratio. This makes high vacuum Scanning Spreading Resistance Microscopy (SSRM) measurements conducted with the NX-Hivac an excellent choice for failure analysis engineers looking to increase their throughput, reduce costs, and improve accuracy.<\/p>\n

\"ssrm-image-of-calibration-stair-sample\"<\/p>\n<\/div>\n

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Park Hivac Manager<\/h3>\n

NX-Hivac auto vacuum control<\/h4>\n

High vacuum is controlled by Hivac Manager, pumping for the optimized vacuum condition and venting processes are logically and visually controlled by one-button clicking. Each process is visually monitored by color and schematic changes, you would not need to worry about the sequence of vacuum operation after clicking on a button. Faster and easier vacuum control software brings you the ease of use AFM operation and better productivity.<\/p>\n<\/div>\n

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\"auto-vacuum-control-software\"<\/div>\n
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Advanced automation features<\/h3>\n

The NX-Hivac features a range of tools that minimize the required input from the user. This means you can scan faster and increase your lab\u2019s throughput.<\/p>\n

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StepScan Automation with Motorized stage<\/h4>\n

StepScan gives users the ability to program the device to image multiple regions quickly and easily. The NX-Hivac lets you scan a sample in just five steps: Scan, lift cantilever, move the motorized stage to user-defined coordinate, approach, and repeat. This boosts productivity enormously and reduces required user input to the absolute minimum.<\/p>\n<\/div>\n

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\"motorized-stage\"<\/div>\n
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Motorized laser alignment<\/h4>\n

Park\u2019s motorized laser beam alignment lets the user seamlessly continue automated measurement routines without user input. With our advanced pre-aligned cantilever holder, the laser beam is focused on the cantilever upon tip exchange. The laser spot is then optimized along the X- and Y-axis by motorized positioning knobs.<\/p>\n<\/div>\n

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\"motorized-laser-alignment\"<\/div>\n
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Increasing accuracy and productivity<\/h2>\n

Although the NX-Hivac is the world\u2019s most accurate high-performance AFM, it is also one of the easiest to use and convenient AFMs for failure analysis applications. With Park NX-Hivac, you can increase your productivity and trust that your results are sound.<\/p>\n

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Closed-loop XY and Z Scanners<\/h3>\n

With two independent closed-loop XY and Z flexure scanners for the sample and probe tip, you can rest assured that your scans will be extremely accurate. The NX-Hivac offers flat and orthogonal XY scanning with a low residual bow, offering out-of-plane motion less than 1 nm over the entire scan range. The NX-Hivac also features a high speeds Z scanner with a 15 \u03bcm scan range and Z scanner non-linearity is less than 0.5%. This provides accurate 2D and 3D measurements with no need for software processing.<\/p>\n

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\"low-noise-xyz-position-sensors\"<\/p>\n

Low Noise XYZ Position Sensors<\/h3>\n

The NX-Hivac features Park AFM\u2019s industry-leading low noise Z detector that can accurately measure sample topography while the low noise XY closed-loop scan minimizes the forward and backward scan gap to less than 0.15% of the scan range.<\/p>\n

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24-bit Digital Electronics<\/h3>\n

\"24-bit-digital-electronics\"Minimize wasted time and maximize accuracy with the trademark NX Series electronics controller featured in the NX-Hivac. Our controller is an all-digital, 24-bit high-speed device which gives the user the ability to perform a wide range of scans including our True Non-Contact mode. With its low noise design and high-speed processing unit, the controller is ideal for precise voltage and current measurement as well as nano-scale imaging. The embedded electronics also feature digital signal processing, allowing users to easily analyze measurements and imaging.<\/p>\n<\/div>\n<\/div>\n

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Brochures<\/h3>\n

park_nx_hivac<\/a><\/p>\n

afm-failure-analysis-brochure<\/a><\/p>\n<\/div>\n<\/div>\n

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Specification<\/h2>\n<\/div>\n
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Scanner<\/h4>\n

XY scanner:<\/strong>\u00a050 \u03bcm \u00d7 50 \u03bcm (100 \u03bcm x 100 \u03bcm optional)\u00a0Z scanner:<\/strong>\u00a015 \u03bcm<\/p>\n<\/div>\n

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Optics<\/h4>\n

Objective lens:<\/strong>\u00a010\u00d7\u00a05M pixel CCD<\/strong><\/p>\n<\/div>\n

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Sample Stage<\/h4>\n

XY stage travel:<\/strong>\u00a022 mm x 22 mm\u00a0Sample size:<\/strong>\u00a050 mm x 50 mm, up to 20 mm thickness<\/p>\n<\/div>\n

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Physical Information<\/h4>\n

Inner vacuum chamber:<\/strong>\u00a0300 mm x 420 mm x 320 mm\u00a0Outer vacuum (including granite & pump):<\/strong>\u00a0800 mm x 950 mm x 730 mm<\/p>\n<\/div>\n

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Software<\/h4>\n

SmartScan:<\/strong>\u00a0Park AFM operating software\u00a0XEI:<\/strong>\u00a0AFM data analysis software\u00a0Hivac Manager:<\/strong>\u00a0Auto vacuum control software<\/p>\n<\/div>\n<\/div>\n

\"nx-hivac\"<\/div>\n
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High Vacuum<\/h4>\n

Vacuum level:<\/strong>\u00a0Typically less than 1 x 10-5<\/sup>\u00a0torr\u00a0Pumping speed:<\/strong>\u00a0Reach to 10-5<\/sup>\u00a0torr within 5 min.<\/p>\n<\/div>\n

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Electronics<\/h4>\n

ADC:<\/strong>\u00a018 channels 4 high-speed ADC channels (50 MSPS) 24-bit ADCs for X, Y, and Z position sensor\u00a0DAC:<\/strong>\u00a017 channels 2 high-speed DAC channels (50 MSPS) 20-bit DACs for X, Y, and Z positioning 3 channels of the integrated lock-in amplifier<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

High vacuum atomic force microscope
\nfor failure analysis and atmosphere-sensitive materials research<\/h2>\n
\n

Park NX-Hivac allows failure analysis engineers to improve the sensitivity and repeatability of their AFM measurements through a high vacuum environment. Because high vacuum measurement offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wider range of signal response in various failure analysis applications, such as dopant concentration of Scanning Spreading Resistance Microscopy (SSRM).<\/p>\n

Park NX-Hivac enables materials scientific research that requires high accuracy and high-resolution measurements in a vacuum environment free from oxygen and other agents.<\/p>\n<\/div>\n","protected":false},"featured_media":1876,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[260,203],"product_tag":[],"class_list":["post-1875","product","type-product","status-publish","has-post-thumbnail","product_cat-high-vacuum-afm","product_cat-microscope","first","instock","shipping-taxable","product-type-simple"],"yoast_head":"\nNX-Hivac \u2013 High Vacuum AFM - umclbd.com | United Marketing Company Limited<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/umclbd.com\/?product=nx-hivac-high-vacuum-afm\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"NX-Hivac \u2013 High Vacuum AFM - umclbd.com | United Marketing Company Limited\" \/>\n<meta property=\"og:description\" content=\"High vacuum atomic force microscope for failure analysis and atmosphere-sensitive materials research Park NX-Hivac allows failure analysis engineers to improve the sensitivity and repeatability of their AFM measurements through a high vacuum environment. 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